Nanoscope Multimode AFM

Nanoscope Multimode AFM

Model: Nanoscope Multimode
Location: 1.2 00 07
Contact: Martin Neubauer

Multimode_AFM Brief description

The Nanoscope MultiMode Atomic Force Microscope is a very high resolution AFM which allow to acquire images on atomic, nanoscopic and macroscopic scales. The microscope performs the full range of SPM techniques to measure surface characteristics including topography, elasticity, friction, and adhesion. Scan sizes up to 15µm lateral and 2.5µm vertical can be realized. Measurements in air and fluids (patented) are feasible. The technique of choice for most AFM work is TapingMode AFM: The topography is measured by "tapping" the surface with an oscillating probe tip. This eliminates shear forces which can damage soft samples and reduce image resolution.

Manufacturer's website: http://www.veeco.com