Instrumentation
Atomic Force Microscopes
|
AFM JPK Nanowizard I
Contact: Daniel Kluge, The JPK Nanowizard I is specialized for imaging and force measurements in both air and liquids. The measurements can be done at several temperature ranges. Therefore, the Nanowizard I is especially wel... more... |
|
Atomic Force Microscope
Model: MFP-3D™ Stand Alone AFM Contact: Volodymyr Kuznetsov, With this device it is possible to display pictures at the scale of atoms. Furthermore we can measure forces in the nanoregime. With some tools as add ons we also can do force distance experiments in ... more... |
|
Combination of Confocal Fluorescence- and Atomic Force Microscope
Contact: Johann Erath, Volodymyr Kuznetsov, In our setup the Confocal Flurescence Microscope (Zeiss LSM 710) is combined with an Atomic Force Microscope (Asylum research, MFP 3D) The LSM 710 is a confocal laser scanning miscroscope ... more... |
|
Dimension 3100 Metrology
Contact: Markus Hund, The system is equipped with a Nanoscope IIIm controller and a special designed tip-scanner for applications which require tighter limits on axis orthogonality, flatness of the xy plane, linearity, accu... more... |
|
Dimension 3100 NanoScope IV
Contact: Markus Hund, This scanning force microscope (SFM) is equipped with a Nanoscope IV controller and a closed-loop XY tip-scanner (1024 x 1024 pixels). NanoScript software enables to develop user-specific software e.... more... |
|
Dimension 3100 NanoScope V
Contact: Markus Hund, This scanning force microscope (SFM) is equipped with a Nanoscope V controller and a hybrid closed-loop XYZ tip-scanner (5120 x 5120 pixels). NanoScript software enables to develop user-specific softwa... more... |
|
Nanoscope Multimode AFM
Model: Nanoscope Multimode Contact: Martin Neubauer, The Nanoscope MultiMode Atomic Force Microscope is a very high resolution AFM which allow to acquire images on atomic, nanoscopic and macroscopic scales. The microscope performs the full range of SPM t... more... |
|
Nanosurf easyScan AFM
Model: Nanosurf easyScan 2 AFM Contact: Martin Neubauer, The easyScan AFM is easy to use and therefore used as demonstration- and practical course- AFM. The complete system (scanhead and electronics) is portable and does fit in a carrying case. The measured ... more... |
Optical Instruments
|
Inverted Microscopes
Contact: Johann Erath, We have two Axiovert 200 inverted fluorescence microscopes. This are high-end microscopes with special features relating to contrast enhancement, illumination and reduction of signal to noise ratio. ... more... |
|
Fluorescence Correlation Microscope
Contact: Dr. Gernot Guigas , The ConfoCor 2 is a Fluorescence Correlation Spectroscope which analyzes fluctuations in fluorescence intensity of labeled particles in a very small confocal volume (around femtoliters). The result o... more... |
|
Ellipsometer
Model: Optrel Multiskop Contact: Christian Kuttner, The ellipsometer "Optrel Multiskop" can be used to analyze smooth, reflecting surfaces. The instrument is capable of the following techniques: • Ellipsometry (determination of thicknesse... more... |
|
Fourier Transform Infrared Spectroscopy
Model: Tensor 27 Contact: Melanie Pretzl, FT-IR-Spectroscopy is used to identify functional groups (e.g. -OH, -CO, -NH, -CN) in gases, liquids, solids and thin films. The spectrometer covers near-infrared and mid-infrared this means in deta... more... |
|
Surface Plasmon Resonance Spectrometer
Contact: Lukas Eisoldt (M.Sc.), The Biacore X system is based on the principle of surface plasmon resonance (SPR). It allows us to investigate the interactions of all kinds of molecules (larger than 1000 Dalton) in solution. The ac... more... |
|
Spectroscopic Ellipsometer (Sentech SE 850)
Contact: Christian Kuttner, The task of a spectroscopic ellipsometer is to determine layer thickness and optical properties of single or multi-layered surfaces. Ellipsometry measures the change of polarization of light upon ... more... |
|
Contact angle and Surface Tension Instrumentation
Model: DataPhysica OCA Contact: Petra Zippelius, This instrument can be used either to measure the interfacial tension by the pendant drop method or to determine the contact angle between a liquid and a solid substrate by the sessile drop method, opt... more... |
|
UV-vis spectrometer
Model: Perkin Elmer Lambda 19 Contact: Katja Trenkenschuh, With this device transmission and angle dependant reflection spectra can be measured. UV-VIS-NIR Spectroscopy is used to determine the position and intensity of absorption bands and their changes du... more... |
Supplementary Equipment
|
Langmuir-Blodgett Instrument
Model: KSV Minitrough System Contact: Katja Trenkenschuh, PC-controlled Langmuir-Blodgett instrument for unsupervised fabrication of multilayer LB-films on solid substrates and for analysis of monolayers. more... |
|
Mikromanipulator
Contact: Johann Erath, Micromanipulator (MP-285, Sutter Instrument) A micromanipulator is a device which is used to physically interact with a sample under optical control by a microscope, where a level of precision of ... more... |
|
Water purification system
Model: MilliQ Advantage A 10 Contact: Melanie Pretzl, Water purification system from Millipore. The water is treated by a UV lamp to ensure the oxidation of organic molecules and the destruction of bacteria. A filtration system removes ionic and or... more... |
|
Photo-resist spinner
Model: 1-EC 101 DT - R 435 Contact: Petra Zippelius, Serial# 711 30 DT by Headway Research inc more... |
|
Plasma Cleaner
Model: PDC-32G Contact: Markus Hund, The plasma cleaner (PDC-32G, Harrick Plasma Inc.) is a simple inductively coupled plasma source (barrel reactor). Low pressure plasma processes work already in a medium vacuum range. For plasma etching... more... |
|
Plasma Cleaner
Model: MiniFlecto + Oxygen Generator Contact: Christoph Hanske, This Plasma Cleaner can be used to etch and clean surfaces or to modify surfaces. Oxygen-Plasma or air-Plasma can remove any organic contamination (e.g. from AFM cantilevers, Si-wafers) and can be used... more... |
|
Ultraviolett / Ozone-Cleaner
Model: PSD Pro Series Contact: Christoph Hanske, Ultraviolet Ozone Systems are mainly used to clean surfaces (e.g. AFM-cantilevers, Silicon-wavers, glass slides...) via oxidation. This system can remove molecular organic contamination with high effec... more... |
|
UIP1000hd (20kHz, 1000W) ultrasonic device
Contact: Daria Andreeva, The UIP1000hd (20kHz, 1000W) is a powerful and adaptable ultrasonic device for lab testing and industrial processing of liquids. It is used for applications, such as emulsifying, dispersing & particle ... more... |
|
Universal Surface Tester
Contact: Petra Zippelius, With the Universal Surface Tester (UST) it is possible to analyse micromechanical, microtribological and fuctional properties of material. The range of measurements are at the sub- and micrometer scale... more... |
|
ZetaView
Model: PMX 100 Contact: Melanie Pretzl, ZetaView combines classical micro-electrophoresis with a laser-scattering video microscopy. The advantage of this instrument is the direct measurement of particle mobility, therefore it is also possibl... more... |